The system can be used to test a number of different types of thermal devices. Switching devices such as bi-metals and thermostats are tested unloaded for calibration using user entered parameters. The system ramps the temperature up and down between set points at a user specified rate and scans the devices under test to determine if a device has changed state. The temperature at the switching point is recorded for each of up to twenty devices. The test system can also test the calibration of thermistors used in newer electronic controls. This process works similar to the switching device tests but the system records the resistance of the thermistor at the pre-selected temperature set points. The system can flag the devices if a failure occurs during the test.